Abstract
This document specifies the design and metrological characteristics of phase shifting interferometry (PSI) instruments for the areal measurement of surface topography. Because surface profiles can be extracted from areal surface topography data, the methods described in this document are also applicable to profiling measurements.
General information
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Status: PublishedPublication date: 2025-02Stage: International Standard published [60.60]
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Edition: 2Number of pages: 18
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Technical Committee :ISO/TC 213ICS :17.040.20
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Life cycle
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Previously
WithdrawnISO 25178-603:2013
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Now