Abstract
PreviewThis document specifies the calibration and adjustment of the metrological characteristics of contact (stylus) instruments for the measurement of surface texture by the profile method as defined in ISO 3274. The calibration and adjustment is intended to be carried out with the aid of measurement standards.
Annex B specifies the calibration and adjustment of metrological characteristics of simplified operator contact (stylus) instruments which do not conform with ISO 3274.
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Status: PublishedPublication date: 2021-12
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Edition: 2Number of pages: 20
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Technical Committee: ISO/TC 213 Dimensional and geometrical product specifications and verification
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- ICS :
- 17.040.30 Measuring instruments
Buy this standard
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Format | Language | |
---|---|---|
std 1 124 | PDF + ePub | |
std 2 124 | Paper |
- CHF124
Life cycle
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Previously
WithdrawnISO 12179:2000
WithdrawnISO 12179:2000/Cor 1:2003
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Now
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Will be replaced by
Under developmentISO/AWI 12179
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