This standard was last reviewed and confirmed in 2019.
Therefore this version remains current.
Abstract
PreviewISO 17470:2014 gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.
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Status: PublishedPublication date: 2014-01
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Edition: 2Number of pages: 10
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- ICS :
- 71.040.99 Other standards related to analytical chemistry
Buy this standard
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| Format | Language | |
|---|---|---|
| std 1 61 | PDF + ePub | |
| std 2 61 | Paper |
- CHF61
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