This standard was last reviewed and confirmed in 2021.
Therefore this version remains current.
Abstract
PreviewISO 25178-72:2017 defines the XML file format x3p for storage and exchange of topography and profile data.
-
Status: PublishedPublication date: 2017-05
-
Edition: 1Number of pages: 23
-
Technical Committee: ISO/TC 213 Dimensional and geometrical product specifications and verification
-
- ICS :
- 17.040.20 Properties of surfaces
Buy this standard
en
| Format | Language | |
|---|---|---|
| std 1 124 | ||
| std 2 124 | Paper |
- CHF124
Life cycle
-
Now
-
00
Preliminary
-
10
Proposal
-
20
Preparatory
-
30
Committee
-
40
Enquiry
-
50
Approval
-
60
Publication
-
90
Review
-
95
Withdrawal
Corrigenda / Amendments
PublishedISO 25178-72:2017/Amd 1:2020
-
00
Got a question?
Check out our FAQs
Customer care
+41 22 749 08 88
Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)