ISO 17901-1:2015 specifies the terms related to optical characteristics of holograms, the method to measure their diffraction efficiency, and the angular and wavelength selectivity measurement methods. These measurement methods are applicable to any type of hologram if the hologram yields a simple diffraction pattern, which means the reconstructed wave can be clearly separated from other diffracted and non-diffracted waves. In other words, holograms that yield complex diffraction patterns are excluded. There are no restrictions on the materials used to form the holograms.
Status: PublishedPublication date: 2015-07
Edition: 1Number of pages: 14
Technical Committee: ISO/TC 172/SC 9 Laser and electro-optical systems
- ICS :
- 31.020 Electronic components in general
This standard contributes to the following Sustainable Development Goal:
Buy this standard
|std 1 92|
|std 2 92||Paper|
A standard is reviewed every 5 years
Stage: 90.93 (Confirmed)
Got a question?
Check out our FAQs
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)
Keep up to date with ISO
Sign up to our newsletter for the latest news, views and product information.