ISO 11938:2012
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ISO 11938:2012
51059

Abstract

 Preview

This International Standard provides procedures for electron microprobe elemental-mapping analysis using

wavelength-dispersive spectrometry. The choice between mapping with the electron beam moving digitally

across the specimen (electron beam mapping) and mapping with stage movement only (large-area mapping) is

assessed. It describes five types of data processing: the raw X‑ray intensity data method, the k‑value method,

the calibration method, the correlation method and the matrix correction method.


General information 

  •  :  Published
     : 2012-03
  •  : 1
     : 10
  •  : ISO/TC 202/SC 2 Electron probe microanalysis
  •  :
    71.040.50 Physicochemical methods of analysis

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std 2 58 Paper
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