ISO 24173:2009
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ISO 24173:2009
42052

Abstract

 Preview

ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.


General information 

  •  :  Published
     : 2009-09
  •  : 1
     : 43
  •  : ISO/TC 202 Microbeam analysis
  •  :
    71.040.50 Physicochemical methods of analysis

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std 1 158 PDF
std 2 158 PDF on CD
  • CHF158

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