Abstract
Describes profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness. Specifies the properties of the instrument which influence profile evaluation. Replaces the first edition of ISO 3274:1975 and ISO 1880:1979.
General information
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Status: PublishedPublication date: 1996-12Stage: International Standard to be revised [90.92]
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Edition: 2Number of pages: 13
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Technical Committee :ISO/TC 213ICS :17.040.30
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Life cycle
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Previously
WithdrawnISO 1880:1979
WithdrawnISO 3274:1975
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Now
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00
Preliminary
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10
Proposal
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20
Preparatory
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30
Committee
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40
Enquiry
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50
Approval
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60
Publication
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90
Review
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95
Withdrawal
Corrigenda
Correct the current edition; free; not included in the text of the existing standard.PublishedISO 3274:1996/Cor 1:1998
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00
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Will be replaced by
Under developmentISO/FDIS 25178-601