Abstract
Specifies measuring methods so that the film/process system can be obtained reproducibly and can also be compared with those of other systems. Describes sensitometric procedures for films exposed directly to X-rays. This second edition cancels and replaces the first edition (1981).
General information
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Status: PublishedPublication date: 1991-08Stage: International Standard confirmed [90.93]
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Edition: 2Number of pages: 10
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Technical Committee :ISO/TC 42ICS :37.040.25
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Life cycle
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Previously
WithdrawnISO 5799:1981
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