Standardization of methods for instrument specification, instrument calibration, instrument operation, data acquisition, data processing, and data analysis in the use of X-ray Reflectometry (XRR) and X-ray Fluorescence (XRF) Analysis for surface chemical and structural analysis.

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published ISO standard *

under the direct responsibility of ISO/TC 201/SC 10

ISO standards under development *

under the direct responsibility of ISO/TC 201/SC 10

Participating members
Observing members

* number includes updates

Reference Title Type
ISO/TC 201/SC 10/SG 1   XRR technique Working group
ISO/TC 201/SC 10/WG 1   XRF technique Working group


Liaison Committees from ISO/TC 201/SC 10

ISO/TC 201/SC 10 can access the documents of the committees below:

Reference Title ISO/IEC
ISO/TC 147 Water quality ISO
ISO/TC 202 Microbeam analysis ISO
ISO/TC 229 Nanotechnologies ISO
Date Month Location TC/SC Note
4 October 2022 Brescia (Italy) ISO/TC 201/SC 10  

* Information definite but meeting not yet formally convened
** Provisional

ISO/TC 201/SC 10 - Secretariat

JISC [Japan]

Japan National Committee for Standardization of Surface Chemical Analysis
#202 Belcom Tsukuba Building
1-2-3 Ninomiya,
Ibaraki 305-0051