Filter :
| Standard and/or project | Stage | TC |
|---|---|---|
|
Optics and optical instruments — Lasers and laser-related equipment — Vocabulary and symbols
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95.99 | ISO/TC 172/SC 9 |
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Optics and optical instruments — Lasers and laser-related equipment — Vocabulary and symbols
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95.99 | ISO/TC 172/SC 9 |
|
Optics and photonics — Lasers and laser-related equipment — Vocabulary and symbols
|
95.99 | ISO/TC 172/SC 9 |
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Optics and photonics — Lasers and laser-related equipment — Vocabulary and symbols
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95.99 | ISO/TC 172/SC 9 |
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Optics and photonics — Lasers and laser-related equipment — Vocabulary and symbols
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90.92 | ISO/TC 172/SC 9 |
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Integrated optics — Vocabulary — Part 1: Basic terms and symbols
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95.99 | ISO/TC 172/SC 9 |
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Integrated optics — Vocabulary — Part 1: Optical waveguide basic terms and symbols
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60.60 | ISO/TC 172/SC 9 |
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Integrated optics — Vocabulary — Part 2: Terms used in classification
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95.99 | ISO/TC 172/SC 9 |
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Integrated optics — Vocabulary — Part 2: Terms used in classification
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60.60 | ISO/TC 172/SC 9 |
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Optics and photonics — Microlens arrays — Part 1: Vocabulary
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95.99 | ISO/TC 172/SC 9 |
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Optics and photonics — Microlens arrays — Part 1: Vocabulary — Technical Corrigendum 1
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95.99 | ISO/TC 172/SC 9 |
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Optics and photonics — Microlens arrays — Part 1: Vocabulary — Technical Corrigendum 2
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95.99 | ISO/TC 172/SC 9 |
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Optics and photonics — Microlens arrays — Part 1: Vocabulary and general properties
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95.99 | ISO/TC 172/SC 9 |
|
Optics and photonics — Microlens arrays — Part 1: Vocabulary
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90.92 | ISO/TC 172/SC 9 |
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Lasers and laser-related equipment — Test methods for determination of the shape of a laser beam wavefront — Part 1: Terminology and fundamental aspects
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90.93 | ISO/TC 172/SC 9 |
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Optics and photonics — Diffractive optics — Vocabulary
|
95.99 | ISO/TC 172/SC 9 |
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Optics and photonics — Diffractive optics — Vocabulary — Technical Corrigendum 1
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95.99 | ISO/TC 172/SC 9 |
|
Optics and photonics — Diffractive optics — Vocabulary
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90.93 | ISO/TC 172/SC 9 |
|
Lasers and laser-related equipment — Test methods for laser-induced damage threshold — Part 1: Definitions and general principles
|
40.60 | ISO/TC 172/SC 9 |
|
Terminology related to microprocessors
|
60.60 | ISO/IEC JTC 1/SC 25 |
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